A Study of Identifying Abnormal Machines by Using Data Mining
碩士 === 國立清華大學 === 工業工程與工程管理學系碩士在職專班 === 105 === LED manufacturing has several production processes. At the end of each process, the operator of that process will perform simple test to verify whether the product is qualified to proceed with next step. After completion of the whole processes, the waf...
Main Authors: | Lin, Chao-Yin, 林昭吟 |
---|---|
Other Authors: | Chen, James C. |
Format: | Others |
Language: | zh-TW |
Published: |
2017
|
Online Access: | http://ndltd.ncl.edu.tw/handle/ke3252 |
Similar Items
-
A Feasibility Study of Diagnosing Abnormal Flight Patterns Using QAR Flight Data
by: Lin, Chao-Hsien, et al.
Published: (2000) -
Using Data Mining to Detect Abnormality in Telecommunication
by: CHENG FU SHAN, et al.
Published: (2001) -
A Study on Mining Abnormal Time Series Data
by: LI,A-LING, et al.
Published: (2017) -
A study on strategy of employment flexibility and the response from workers - Using professionals under different employment relationships as an example
by: Chao-Yin Lin, et al.
Published: (2004) -
Mining the Yield Patterns of Semiconductor Wafer to Identify Abnormal Process Equipments
by: Yang, Chin-Yi, et al.
Published: (2006)