Influence of Growth-induced Surface Roughness on the Optoelectronic Characteristic and Reliability of InGaN Light Emitting Diode Chips

碩士 === 國立彰化師範大學 === 光電科技研究所 === 105 === In this thesis, the influence of growth-induced surface roughness on the optoelectronic characteristic and reliability of InGaN light emitting diode chips are investigated. First of all, the basic characteristics of light emitting diodes (LEDs) including the o...

Full description

Bibliographic Details
Main Authors: Yang, Wen-Chu, 楊文筑
Other Authors: Huang, Man-Fang
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/9tcd82