The Location and Root Cause of the VLSI Leakage Path
碩士 === 國立交通大學 === 工學院半導體材料與製程設備學程 === 105 === In this thesis, how to locate the single device leakage path of VLSI via failure analysis of Fourier transform application is the major research, we need to identify the root cause for unknown error product. Issued from the circuit designed by customer,...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
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| Online Access: | http://ndltd.ncl.edu.tw/handle/7m4r2e |