Influences of Ultraviolet Exposure and Structural Changes on the Characteristics of p-Type SnO Thin Film Transistors

Influences of Ultraviolet Exposure and Structural Changes on the Characteristics of p-Type SnO Thin Film Transistors

碩士 === 國立交通大學 === 電子研究所 === 105

Bibliographic Details
Main Authors:	He, Ren-Chiuan, 何任詮
Other Authors:	Albert, Chin
Format:	Others
Language:	en_US
Published:	2017
Online Access:	http://ndltd.ncl.edu.tw/handle/337t8w

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