Influences of Ultraviolet Exposure and Structural Changes on the Characteristics of p-Type SnO Thin Film Transistors

碩士 === 國立交通大學 === 電子研究所 === 105

Bibliographic Details
Main Authors: He, Ren-Chiuan, 何任詮
Other Authors: Albert, Chin
Format: Others
Language:en_US
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/337t8w