Autonomous Testing for 3D-ICs with IEEE Std. 1687
碩士 === 國立成功大學 === 電機工程學系 === 105 === IEEE Std. 1687, or IJTAG, defines flexible serial scan-based architectures for accessing embedded instruments efficiently. In this thesis, we present a novel test architecture that employs IEEE Std. 1687 together with an efficient test controller to carry out 3D-...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/52a5zn |