Repairable Cell-Based Chip Design for Simultaneous Yield Enhancement and Fault Diagnosis
碩士 === 國立成功大學 === 電機工程學系 === 105 === Fault diagnosis plays a major role in IC yield enhancement. Due to circuit structure and ATPG limitation, there exist many undistinguished fault pairs after applying test patterns and diagnosis patterns, including equivalent fault pairs and aborted fault pairs. T...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/n863jj |