Dislocation Structure Analysis of Deformed and Annealed Crofer 22 H Stainless Steel using ECCI Technique

碩士 === 國立成功大學 === 材料科學及工程學系 === 105 === Electron channeling contrast imaging (ECCI) is a powerful technique in the scanning electron microscope (SEM), which can be used to observe crystal defects near the surface of bulk materials in nano-scale, such as dislocations, stacking faults and nano-twins....

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Bibliographic Details
Main Authors: Ting-YiWu, 吳庭宜
Other Authors: Jui-Chao Kuo
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/fmwwj9