Dislocation Structure Analysis of Deformed and Annealed Crofer 22 H Stainless Steel using ECCI Technique
碩士 === 國立成功大學 === 材料科學及工程學系 === 105 === Electron channeling contrast imaging (ECCI) is a powerful technique in the scanning electron microscope (SEM), which can be used to observe crystal defects near the surface of bulk materials in nano-scale, such as dislocations, stacking faults and nano-twins....
| Main Authors: | , |
|---|---|
| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2017
|
| Online Access: | http://ndltd.ncl.edu.tw/handle/fmwwj9 |
| Summary: | 碩士 === 國立成功大學 === 材料科學及工程學系 === 105 === Electron channeling contrast imaging (ECCI) is a powerful technique in the scanning electron microscope (SEM), which can be used to observe crystal defects near the surface of bulk materials in nano-scale, such as dislocations, stacking faults and nano-twins. In this study, we used Crofer 22 H stainless steel to observe the microstructure after deformation and annealing in a bcc structure. By the invisibility criteria of transmission electron microscope (TEM), it is possible to analyze the slip system with ECCI taken at different g vectors. By comparing ECCI after different steps of annealing, we observed the evolution of dislocation structure and the precipitation.
|
|---|