Fabrication and Measurement of Thermal Type Altimeters

碩士 === 國立高雄應用科技大學 === 光電與通訊工程研究所 === 105 === This study designs and manufactures the first thermal type barometer altimeter to replace current piezoresistive and capacitive altimeters. The thermal type barometer altimeters have the advantage of smaller size and simpler process compared with commerci...

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Main Authors: LI, MENG-JHE, 李孟哲
Other Authors: CHEN, CHUNG-NAN
Format: Others
Language:zh-TW
Published: 2017
Online Access:http://ndltd.ncl.edu.tw/handle/c9y77y
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spelling ndltd-TW-105KUAS08010162019-05-15T23:32:33Z http://ndltd.ncl.edu.tw/handle/c9y77y Fabrication and Measurement of Thermal Type Altimeters 熱阻型高度計製作與量測 LI, MENG-JHE 李孟哲 碩士 國立高雄應用科技大學 光電與通訊工程研究所 105 This study designs and manufactures the first thermal type barometer altimeter to replace current piezoresistive and capacitive altimeters. The thermal type barometer altimeters have the advantage of smaller size and simpler process compared with commercial piezoresistive and capacitive altimeters. The material with temperature coefficient of resistance formed on a thermally isolated suspended structure was used as a sensing resistor of the thermal altimeter. The temperature of the sensing resistor was heated up and changed with altitude due to the variation through gas heat loss around the sensing device, and it results in the change of the resistor’s resistance. Eventually, the variation of resistance can be readout by a Wheatstone bridge circuit. In this dissertation, thermal type barometer altimeter with a microbridge structure and a narrow gap were fabricated by adopting CMOS process and bulk micromachining. The bulk micromachining can prevent the sensor membrane from sticking onto the substrate. A aluminum thin film was used as a sensing resistor of the thermal altimeter. The temperature coefficient of resistance of the sensing resistor and the pressure response of the device were measured in this work. And then the sensitivity of the sensor can be calculated. For the measurement of altitude response, the thermal type barometer altimeter was connected to a Wheatstone bridge circuit and an amplification circuit to measure altitude reponse. In this study, the thermal type barometer altimeter was manufactured successfully. The equivalent depth of gap and the resistance of altimeter are 1.4 μm and 67 Ω, respectively. According to the measurement results of pressure response, the sensitivity of the theoretical altitude response was estimated as 0.4 μV/m under bias voltage of 1.054 V and a heating temperature was 170 °C. The output voltage difference of the altimeter was amplified 200 times and measured as 0.077 V between the altitude change of the second floor and sixth floor at same operating condition. Base on the result of height response, the thermal type barometer altimeter has the potential for development. CHEN, CHUNG-NAN 陳忠男 2017 學位論文 ; thesis 69 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立高雄應用科技大學 === 光電與通訊工程研究所 === 105 === This study designs and manufactures the first thermal type barometer altimeter to replace current piezoresistive and capacitive altimeters. The thermal type barometer altimeters have the advantage of smaller size and simpler process compared with commercial piezoresistive and capacitive altimeters. The material with temperature coefficient of resistance formed on a thermally isolated suspended structure was used as a sensing resistor of the thermal altimeter. The temperature of the sensing resistor was heated up and changed with altitude due to the variation through gas heat loss around the sensing device, and it results in the change of the resistor’s resistance. Eventually, the variation of resistance can be readout by a Wheatstone bridge circuit. In this dissertation, thermal type barometer altimeter with a microbridge structure and a narrow gap were fabricated by adopting CMOS process and bulk micromachining. The bulk micromachining can prevent the sensor membrane from sticking onto the substrate. A aluminum thin film was used as a sensing resistor of the thermal altimeter. The temperature coefficient of resistance of the sensing resistor and the pressure response of the device were measured in this work. And then the sensitivity of the sensor can be calculated. For the measurement of altitude response, the thermal type barometer altimeter was connected to a Wheatstone bridge circuit and an amplification circuit to measure altitude reponse. In this study, the thermal type barometer altimeter was manufactured successfully. The equivalent depth of gap and the resistance of altimeter are 1.4 μm and 67 Ω, respectively. According to the measurement results of pressure response, the sensitivity of the theoretical altitude response was estimated as 0.4 μV/m under bias voltage of 1.054 V and a heating temperature was 170 °C. The output voltage difference of the altimeter was amplified 200 times and measured as 0.077 V between the altitude change of the second floor and sixth floor at same operating condition. Base on the result of height response, the thermal type barometer altimeter has the potential for development.
author2 CHEN, CHUNG-NAN
author_facet CHEN, CHUNG-NAN
LI, MENG-JHE
李孟哲
author LI, MENG-JHE
李孟哲
spellingShingle LI, MENG-JHE
李孟哲
Fabrication and Measurement of Thermal Type Altimeters
author_sort LI, MENG-JHE
title Fabrication and Measurement of Thermal Type Altimeters
title_short Fabrication and Measurement of Thermal Type Altimeters
title_full Fabrication and Measurement of Thermal Type Altimeters
title_fullStr Fabrication and Measurement of Thermal Type Altimeters
title_full_unstemmed Fabrication and Measurement of Thermal Type Altimeters
title_sort fabrication and measurement of thermal type altimeters
publishDate 2017
url http://ndltd.ncl.edu.tw/handle/c9y77y
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AT lǐmèngzhé fabricationandmeasurementofthermaltypealtimeters
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AT lǐmèngzhé rèzǔxínggāodùjìzhìzuòyǔliàngcè
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