An Expandable Testing Platform Structure for Embedded Systems

• Main Authors: Wu,Rui-Ming, 伍瑞銘
• Other Authors: Wu,Hong-Zhang
• Format: Others
• Language: zh-TW
• Published: 2017
• Online Access: http://ndltd.ncl.edu.tw/handle/s9d5r3

碩士 === 逢甲大學 === 電子工程學系 === 105 === The embedded systems applications are growing quickly, like home applications, transportation systems, medical devices, The embedded system chip demands are rising for the embedded system board products. To programming chips and testing spend a lot Time. If we have an expandable testing platform with a variety of interfaces. And in line with most of the test chip or completed product for custom function test, you can significantly reduce test time and cost for the production line between different I / O function. This paper realizes the design of an expandable testing platform structure, so that it can be expansile in the software and hardware. The expandable testing platform uses the μC / OS-II real-time operating system core designed by Micrium to control the system of the expandable testing platform and the allocation of CPU resources. The hardware part uses the Tower System Modular Development Board Platform. It is an embedded system development module developed by NXP Semiconductors which enables both hardware and software to be easy in maintained and in expantion by modular management.