| Summary: | 碩士 === 中原大學 === 工業與系統工程研究所 === 105 === Since 1996, the technology of white light has an important breakthrough in the emitting diode (LED), it would be announce the light generation of fourth stage, it’s also can call the low-power lighting generation. In the future, backlight technology is still developing by the technical background of LED in the application of the panel market, so the LED must be developed toward the higher accuracy.
The first objective of this research about the relationship between the LED test values and standards, then we can use the regression analysis to find out the relationship between the variables quickly that can improve the ability of efficiency and prediction. The second objective of this research about the machine and material difference analysis of variation, it will use Gauge R&R, control chart, prediction interval, ANOVA methods to decrease the process factor variation by mass database. Finally, according to the results of this study case, the lead time of calibration can be shortened, and improving calibration and measurement errors, then the tolerance of CIE and the brightness can be decreased in mass production stage. This result shows it can use control chart, prediction interval method to find out variation of process immediately, and to adjust them. We need to use those methods to promote the optical accuracy and process.
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