Mechanism of Microvoid Formation and Their Prevention in Micro-scale Joints

碩士 === 元智大學 === 化學工程與材料科學學系 === 104 === In recent years, as electronic products tend to lighter and higher performance, the development of the size in transistors becomes more difficult. In order to offers a much greater vertical interconnect density, 3D IC (three-dimensional integrated circuits) is...

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Bibliographic Details
Main Authors: Chih-Tsung Chen, 陳智琮
Other Authors: Cheng-En Ho
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/14697506059305099229

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