Coupling of microfluidic paper-based separation devices and time-of-flight secondary ion mass spectroscopy (ToF-SIMS) for analyzing molecular mixtures
碩士 === 國立臺灣大學 === 材料科學與工程學研究所 === 104 === Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a promising surface characterization technique that is able to address spectral analysis and direct imaging. With recent development of cluster ion beams, molecular species could also be examined a...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/40587187689657153557 |