A Fast Sweep-Line-Based Failure Pattern Extractor for Memory Diagnosis
碩士 === 國立清華大學 === 電機工程學系 === 104 === Memories have been considered as one of the major drivers of CMOS technology, due to their high density, high capacity, critical timing, sensitivity, etc. Memory diagnosis is therefore important for technology and product development. Memory failure pattern ident...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/12722879034890103462 |