Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies

博士 === 國立清華大學 === 資訊工程學系 === 104 === Power consumption has become one of the primary bottlenecks to meet the Moore's law. To deal with this issue, many emerging low power technologies have been explored recently. At the design level, traditionally, we expect that circuit designs can be execut...

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Main Authors: Huang, Ching-Yi, 黃敬懿
Other Authors: Wang, Chun-Yao
Format: Others
Language:en_US
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/53816975908597132529
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spelling ndltd-TW-104NTHU53920392017-07-16T04:29:25Z http://ndltd.ncl.edu.tw/handle/53816975908597132529 Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies 用於低功耗新興技術之分析、合成以及最佳化的研究 Huang, Ching-Yi 黃敬懿 博士 國立清華大學 資訊工程學系 104 Power consumption has become one of the primary bottlenecks to meet the Moore's law. To deal with this issue, many emerging low power technologies have been explored recently. At the design level, traditionally, we expect that circuit designs can be executed without errors. However, for error resilient applications such as image processing, 100% correctness is not necessary. By pursuing less than 100% correctness, power consumption can be significantly reduced. Recently, Probabilistic CMOS (PCMOS) and Probabilistic Boolean Circuits (PBCs) have been proposed to deal with power consumption issue. On the other hand, at the device level, Single-Electron Transistor (SET) at room temperature has been demonstrated as a promising device for extending Moore's law due to its ultra low power consumption. Furthermore, a reconfigurable SET array architecture has been proposed to deal with the reliability issue. Recently, several automated mapping approaches were proposed for area minimization of reconfigurable SET arrays. However, the automation flows for these two technologies are still not robust. For the PBC technology, no correctness analysis and power optimization algorithms were proposed. As for the SET array technology, no mapping algorithms considering the existence of defective nanowire segments were proposed. Furthermore, before the defect-aware mapping, we have to know the locations of defects in SET arrays. Therefore, in this dissertation, we propose corresponding solutions to deal with these issues. For the part of PBC, we first propose a statistical approach for evaluating the correctness of PBCs. Then, we propose strategies for power optimization of PBCs. Finally, we integrate these strategies with the correctness analysis as a power optimization algorithm for PBCs. The experimental results show that the proposed correctness analysis method is highly efficient and accurate, and that the power optimization algorithm saves 36% of total power-delay-product on average under a correctness constraint of 90% on a set of IWLS 2005 benchmarks. For the part of SET array, this dissertation presents the first diagnosis approach to identify the locations of defects in SET arrays followed by two defect-aware algorithms for mapping SET arrays in different scenarios. The experimental results show that the proposed diagnosis method can detect 100% of defects under a defect rate and distribution in SET arrays. As for the mapping algorithms, the results show that our approach can successfully map the SET arrays with 11.13% and 7.69% width overhead on average in the baseline detour mapping algorithm and defect-reuse mapping algorithm, respectively, in the presence of 5000 ppm defects. Wang, Chun-Yao 王俊堯 2016 學位論文 ; thesis 90 en_US
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description 博士 === 國立清華大學 === 資訊工程學系 === 104 === Power consumption has become one of the primary bottlenecks to meet the Moore's law. To deal with this issue, many emerging low power technologies have been explored recently. At the design level, traditionally, we expect that circuit designs can be executed without errors. However, for error resilient applications such as image processing, 100% correctness is not necessary. By pursuing less than 100% correctness, power consumption can be significantly reduced. Recently, Probabilistic CMOS (PCMOS) and Probabilistic Boolean Circuits (PBCs) have been proposed to deal with power consumption issue. On the other hand, at the device level, Single-Electron Transistor (SET) at room temperature has been demonstrated as a promising device for extending Moore's law due to its ultra low power consumption. Furthermore, a reconfigurable SET array architecture has been proposed to deal with the reliability issue. Recently, several automated mapping approaches were proposed for area minimization of reconfigurable SET arrays. However, the automation flows for these two technologies are still not robust. For the PBC technology, no correctness analysis and power optimization algorithms were proposed. As for the SET array technology, no mapping algorithms considering the existence of defective nanowire segments were proposed. Furthermore, before the defect-aware mapping, we have to know the locations of defects in SET arrays. Therefore, in this dissertation, we propose corresponding solutions to deal with these issues. For the part of PBC, we first propose a statistical approach for evaluating the correctness of PBCs. Then, we propose strategies for power optimization of PBCs. Finally, we integrate these strategies with the correctness analysis as a power optimization algorithm for PBCs. The experimental results show that the proposed correctness analysis method is highly efficient and accurate, and that the power optimization algorithm saves 36% of total power-delay-product on average under a correctness constraint of 90% on a set of IWLS 2005 benchmarks. For the part of SET array, this dissertation presents the first diagnosis approach to identify the locations of defects in SET arrays followed by two defect-aware algorithms for mapping SET arrays in different scenarios. The experimental results show that the proposed diagnosis method can detect 100% of defects under a defect rate and distribution in SET arrays. As for the mapping algorithms, the results show that our approach can successfully map the SET arrays with 11.13% and 7.69% width overhead on average in the baseline detour mapping algorithm and defect-reuse mapping algorithm, respectively, in the presence of 5000 ppm defects.
author2 Wang, Chun-Yao
author_facet Wang, Chun-Yao
Huang, Ching-Yi
黃敬懿
author Huang, Ching-Yi
黃敬懿
spellingShingle Huang, Ching-Yi
黃敬懿
Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies
author_sort Huang, Ching-Yi
title Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies
title_short Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies
title_full Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies
title_fullStr Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies
title_full_unstemmed Analysis, Synthesis, and Optimization for Low-Power Emerging Technologies
title_sort analysis, synthesis, and optimization for low-power emerging technologies
publishDate 2016
url http://ndltd.ncl.edu.tw/handle/53816975908597132529
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