| Summary: | 碩士 === 國立清華大學 === 先進光源科技學位學程 === 104 === In this study, we focus on 2D material interface and measured the band structure by Scanning Photo-Electron Microscopy (SPEM) at National Synchrotron Radiation Research Center (NSRRC). The experiment with two topics: (1) Graphene/ZnO heterojunction, and (2) MoS2/WS2 heterostructures. From the topic (1), we found ZnO with flat band structure contact to the interface, and it was quite different from the results of Schottky contact in literature. In topic (2), we compared two MoS2/WS2 hetero- structures with different bonding at the interface (Van der Waals bond and covalent bond), and we found the structures have distinct band structure properties. With these new results, we believe it will contribute to the application of two-dimensional materials in the future.
Keywords: 2D material, band structure, X-ray photoelectron spectroscopy, graphene, transition-metal dichalcogenide
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