The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands
碩士 === 國立彰化師範大學 === 電機工程學系 === 104 === The more and more high-power devices like arc furnaces, electric welders, air compressors are used widely in recent year. These high-power devices will cause voltage fluctuations. And the voltage fluctuations will cause bad power quality causing the machine...
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ndltd-TW-104NCUE54420262017-08-27T04:30:15Z http://ndltd.ncl.edu.tw/handle/87207678824636151600 The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands 測量不同頻帶之間諧波所造成的電壓閃爍 Deng,Shih-Syong 鄧世雄 碩士 國立彰化師範大學 電機工程學系 104 The more and more high-power devices like arc furnaces, electric welders, air compressors are used widely in recent year. These high-power devices will cause voltage fluctuations. And the voltage fluctuations will cause bad power quality causing the machine malfunction or the damage of the machine. It will also make the illumination equipment have phenomenon of light flicker. Light flicker may make human eyes uncomfortable, fatigue, dizziness. Therefore, the IEC 61000-4-15 is proposed to regulate the voltage flicker by International Electrotechnical Commission. Moreover, the short-term flicker severity and long-term flicker severity are defined to calculate the flicker severity index. Due to the IEC standard procedures have squaring calculation and bandpass filter, it cause the IEC standard could not evaluate voltage fluctuations containing interharmonic components with the frequency higher than 102Hz and lower than 18Hz. Therefore, this study proposes the filters for the interharmonic frequency, and the short-term flicker severity value will be calculate by the half-wave RMS method and the follow procedures. Then, we compared the results it with the experimental results of IEC method to reveal the IEC standard characteristic. The purpose is to reduce the error of detection and analyze the spectra components of interharmonic frequencies, so that the IEC flickermeter is improved. Wang,Chau-Shing 王朝興 2016 學位論文 ; thesis 77 zh-TW |
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碩士 === 國立彰化師範大學 === 電機工程學系 === 104 === The more and more high-power devices like arc furnaces, electric welders, air compressors are used widely in recent year. These high-power devices will cause voltage fluctuations. And the voltage fluctuations will cause bad power quality causing the machine malfunction or the damage of the machine. It will also make the illumination equipment have phenomenon of light flicker. Light flicker may make human eyes uncomfortable, fatigue, dizziness. Therefore, the IEC 61000-4-15 is proposed to regulate the voltage flicker by International Electrotechnical Commission. Moreover, the short-term flicker severity and long-term flicker severity are defined to calculate the flicker severity index.
Due to the IEC standard procedures have squaring calculation and bandpass filter, it cause the IEC standard could not evaluate voltage fluctuations containing interharmonic components with the frequency higher than 102Hz and lower than 18Hz. Therefore, this study proposes the filters for the interharmonic frequency, and the short-term flicker severity value will be calculate by the half-wave RMS method and the follow procedures. Then, we compared the results it with the experimental results of IEC method to reveal the IEC standard characteristic. The purpose is to reduce the error of detection and analyze the spectra components of interharmonic frequencies, so that the IEC flickermeter is improved.
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author2 |
Wang,Chau-Shing |
author_facet |
Wang,Chau-Shing Deng,Shih-Syong 鄧世雄 |
author |
Deng,Shih-Syong 鄧世雄 |
spellingShingle |
Deng,Shih-Syong 鄧世雄 The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands |
author_sort |
Deng,Shih-Syong |
title |
The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands |
title_short |
The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands |
title_full |
The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands |
title_fullStr |
The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands |
title_full_unstemmed |
The Measurement of Voltage Flicker Caused By Interharmonics Based on Various Frequency Bands |
title_sort |
measurement of voltage flicker caused by interharmonics based on various frequency bands |
publishDate |
2016 |
url |
http://ndltd.ncl.edu.tw/handle/87207678824636151600 |
work_keys_str_mv |
AT dengshihsyong themeasurementofvoltageflickercausedbyinterharmonicsbasedonvariousfrequencybands AT dèngshìxióng themeasurementofvoltageflickercausedbyinterharmonicsbasedonvariousfrequencybands AT dengshihsyong cèliàngbùtóngpíndàizhījiānxiébōsuǒzàochéngdediànyāshǎnshuò AT dèngshìxióng cèliàngbùtóngpíndàizhījiānxiébōsuǒzàochéngdediànyāshǎnshuò AT dengshihsyong measurementofvoltageflickercausedbyinterharmonicsbasedonvariousfrequencybands AT dèngshìxióng measurementofvoltageflickercausedbyinterharmonicsbasedonvariousfrequencybands |
_version_ |
1718519253755232256 |