The investigation of highly ordered Ag films on mica with STM, LEED and XPS
碩士 === 國立中央大學 === 物理學系 === 104 === In this study, the Ag thin films of different thickness were grown on freshly cleaved mica. We investigated these thin films with scanning tunneling microscopy (STM), low energy electron diffraction (LEED) and X-ray photoemission spectroscopy (XPS). In the ex...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2016
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| Online Access: | http://ndltd.ncl.edu.tw/handle/jrkrsj |