Group Testing on Graphs
碩士 === 國立交通大學 === 應用數學系所 === 104 === The idea of group testing originated from the blood testing in 1943 by Dorfman. Li was the first who studied the combinatorial group testing as follows. Consider a population V of n items consisting of an unknown subset D Ď V of d defectives. The problem is to id...
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ndltd-TW-104NCTU55070942017-09-06T04:22:24Z http://ndltd.ncl.edu.tw/handle/02405190278298874964 Group Testing on Graphs 圖上的群試 Lee,Meng-Hsun 李孟勳 碩士 國立交通大學 應用數學系所 104 The idea of group testing originated from the blood testing in 1943 by Dorfman. Li was the first who studied the combinatorial group testing as follows. Consider a population V of n items consisting of an unknown subset D Ď V of d defectives. The problem is to identify the set D by a sequence of group tests. Each test is on a subset X of V with two possible outcomes: a negative outcome indicates that X X D = H, a positive outcome indicates that X X D H. The goal is to minimize the number M[d; n] of tests under the worst scenario. This thesis mainly studies group testing on bipartite graphs. That is, the set of items are separated into two disjoint subsets and a defective complex comes from these two sets one from each. By associating each item with a vertex, the sample space can be represented by a bipartite graph where each edge represents a sample point of the space S(2; n). In order to show this problem, Chang and Hwang conjectured that a bipartite graph with 2k(k ą 0) edges always has a subgraph, induced by a subset of vertices, with exactly 2k1 edges. If this conjecture is true then a binary splitting algorithm can be applied to determine the defective complexes with minimum number of tests in sequential algorithm. While the conjecture remains open, it has stimulated my forthcoming reserach casting group testing on graphs. Fu,Hung-Lin 傅恒霖 2016 學位論文 ; thesis 25 en_US |
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碩士 === 國立交通大學 === 應用數學系所 === 104 === The idea of group testing originated from the blood testing in 1943 by Dorfman. Li was
the first who studied the combinatorial group testing as follows. Consider a population
V of n items consisting of an unknown subset D Ď V of d defectives. The problem is to
identify the set D by a sequence of group tests. Each test is on a subset X of V with two
possible outcomes: a negative outcome indicates that X X D = H, a positive outcome
indicates that X X D H. The goal is to minimize the number M[d; n] of tests under
the worst scenario.
This thesis mainly studies group testing on bipartite graphs. That is, the set of items
are separated into two disjoint subsets and a defective complex comes from these two
sets one from each. By associating each item with a vertex, the sample space can be
represented by a bipartite graph where each edge represents a sample point of the space
S(2; n). In order to show this problem, Chang and Hwang conjectured that a bipartite
graph with 2k(k ą 0) edges always has a subgraph, induced by a subset of vertices, with
exactly 2k1 edges. If this conjecture is true then a binary splitting algorithm can be
applied to determine the defective complexes with minimum number of tests in sequential
algorithm. While the conjecture remains open, it has stimulated my forthcoming reserach
casting group testing on graphs.
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author2 |
Fu,Hung-Lin |
author_facet |
Fu,Hung-Lin Lee,Meng-Hsun 李孟勳 |
author |
Lee,Meng-Hsun 李孟勳 |
spellingShingle |
Lee,Meng-Hsun 李孟勳 Group Testing on Graphs |
author_sort |
Lee,Meng-Hsun |
title |
Group Testing on Graphs |
title_short |
Group Testing on Graphs |
title_full |
Group Testing on Graphs |
title_fullStr |
Group Testing on Graphs |
title_full_unstemmed |
Group Testing on Graphs |
title_sort |
group testing on graphs |
publishDate |
2016 |
url |
http://ndltd.ncl.edu.tw/handle/02405190278298874964 |
work_keys_str_mv |
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