Circuit Analysis of Switched-Capacitor Converter

碩士 === 國立交通大學 === 電機工程學系 === 104 === With the progress of semiconductor process from submicron meter to deep submicron meter such as 0.35μm, 0.25μm, 0.18μm, 0.13μm and even 40nm, the devices are made smaller generation by generation, and the power supply voltage levels for the smaller devices also d...

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Bibliographic Details
Main Authors: Liu, Shih-Hao, 劉世晧
Other Authors: Chen, Ke-Horng
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/urtm4p