Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory

碩士 === 國立交通大學 === 電子工程學系電子研究所 === 104

Bibliographic Details
Main Authors:	Huang, Chu-Jie, 黃楚傑
Other Authors:	Tseng, Tseung-Yuen
Format:	Others
Language:	en_US
Published:	2016
Online Access:	http://ndltd.ncl.edu.tw/handle/rtkn6u

id	ndltd-TW-104NCTU5428127
record_format	oai_dc
spelling	ndltd-TW-104NCTU54281272019-05-15T23:08:41Z http://ndltd.ncl.edu.tw/handle/rtkn6u Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory 二氧化鉿金屬橋樑電阻式記憶體之可靠度研究 Huang, Chu-Jie 黃楚傑碩士國立交通大學電子工程學系電子研究所 104 Tseng, Tseung-Yuen 曾俊元 2016 學位論文 ; thesis 103 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立交通大學 === 電子工程學系電子研究所 === 104
author2	Tseng, Tseung-Yuen
author_facet	Tseng, Tseung-Yuen Huang, Chu-Jie 黃楚傑
author	Huang, Chu-Jie 黃楚傑
spellingShingle	Huang, Chu-Jie 黃楚傑 Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory
author_sort	Huang, Chu-Jie
title	Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory
title_short	Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory
title_full	Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory
title_fullStr	Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory
title_full_unstemmed	Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory
title_sort	reliability improvement in hfo2-based conductive bridge random access memory
publishDate	2016
url	http://ndltd.ncl.edu.tw/handle/rtkn6u
work_keys_str_mv	AT huangchujie reliabilityimprovementinhfo2basedconductivebridgerandomaccessmemory AT huángchǔjié reliabilityimprovementinhfo2basedconductivebridgerandomaccessmemory AT huangchujie èryǎnghuàjiājīnshǔqiáoliángdiànzǔshìjìyìtǐzhīkěkàodùyánjiū AT huángchǔjié èryǎnghuàjiājīnshǔqiáoliángdiànzǔshìjìyìtǐzhīkěkàodùyánjiū
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Reliability Improvement in HfO2-Based Conductive Bridge Random Access Memory

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