Fabrication and Characterization of GaN-based Semiconductor Devices on Si Substrates for High-Power Electronic Applications

博士 === 國立交通大學 === 材料科學與工程學系所 === 104 === The integration of GaN-based High Electron Mobility Transistors (HEMTs) and a large diameter Si substrate are promising candidates for next-generation high power device applications owing to the high current, high breakdown, and low fabrication cost. This the...

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Bibliographic Details
Main Authors: Hsieh, Ting-En, 謝廷恩
Other Authors: Chang, Edward-Yi
Format: Others
Language:en_US
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/17580540732119249671

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