Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
碩士 === 國立成功大學 === 微電子工程研究所 === 104 === CuInSe2 nanowire photovoltaic has been the subject of research with a view to enhancing the photo absorption efficiency and reducing the material consumption compared with bulk and thin-film PV. However, its surface recombination is a problem. Therefore, we use...
Main Authors: | , |
---|---|
Other Authors: | |
Format: | Others |
Language: | zh-TW |
Published: |
2016
|
Online Access: | http://ndltd.ncl.edu.tw/handle/2dgu6t |
id |
ndltd-TW-104NCKU5428027 |
---|---|
record_format |
oai_dc |
spelling |
ndltd-TW-104NCKU54280272019-05-15T22:54:09Z http://ndltd.ncl.edu.tw/handle/2dgu6t Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire 以CuInSe2奈米柱製備核殼結構二極體特性之研究 Chia-ChunLin 林嘉峻 碩士 國立成功大學 微電子工程研究所 104 CuInSe2 nanowire photovoltaic has been the subject of research with a view to enhancing the photo absorption efficiency and reducing the material consumption compared with bulk and thin-film PV. However, its surface recombination is a problem. Therefore, we use the core-shell structure to solve the problem. In this study, we employ the annealing process and tune the temperature to improve the crystallization of CIS nanowire. In I-V measurement, we obtained leakage current Io near 49.1nA. Then, we fabricated core-shell structure with PEDOT/CIS material to reduce the defects near the surface of nanowire. In I-V measurement, we obtained leakage current Io near 36.9nA. Mau-Phon Houng 洪茂峰 2016 學位論文 ; thesis 91 zh-TW |
collection |
NDLTD |
language |
zh-TW |
format |
Others
|
sources |
NDLTD |
description |
碩士 === 國立成功大學 === 微電子工程研究所 === 104 === CuInSe2 nanowire photovoltaic has been the subject of research with a view to enhancing the photo absorption efficiency and reducing the material consumption compared with bulk and thin-film PV. However, its surface recombination is a problem. Therefore, we use the core-shell structure to solve the problem. In this study, we employ the annealing process and tune the temperature to improve the crystallization of CIS nanowire. In I-V measurement, we obtained leakage current Io near 49.1nA. Then, we fabricated core-shell structure with PEDOT/CIS material to reduce the defects near the surface of nanowire. In I-V measurement, we obtained leakage current Io near 36.9nA.
|
author2 |
Mau-Phon Houng |
author_facet |
Mau-Phon Houng Chia-ChunLin 林嘉峻 |
author |
Chia-ChunLin 林嘉峻 |
spellingShingle |
Chia-ChunLin 林嘉峻 Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire |
author_sort |
Chia-ChunLin |
title |
Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire |
title_short |
Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire |
title_full |
Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire |
title_fullStr |
Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire |
title_full_unstemmed |
Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire |
title_sort |
study of core-shell diode characteristic with cuinse2 nanowire |
publishDate |
2016 |
url |
http://ndltd.ncl.edu.tw/handle/2dgu6t |
work_keys_str_mv |
AT chiachunlin studyofcoreshelldiodecharacteristicwithcuinse2nanowire AT línjiājùn studyofcoreshelldiodecharacteristicwithcuinse2nanowire AT chiachunlin yǐcuinse2nàimǐzhùzhìbèihékéjiégòuèrjítǐtèxìngzhīyánjiū AT línjiājùn yǐcuinse2nàimǐzhùzhìbèihékéjiégòuèrjítǐtèxìngzhīyánjiū |
_version_ |
1719136871574929408 |