Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire

碩士 === 國立成功大學 === 微電子工程研究所 === 104 === CuInSe2 nanowire photovoltaic has been the subject of research with a view to enhancing the photo absorption efficiency and reducing the material consumption compared with bulk and thin-film PV. However, its surface recombination is a problem. Therefore, we use...

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Main Authors: Chia-ChunLin, 林嘉峻
Other Authors: Mau-Phon Houng
Format: Others
Language:zh-TW
Published: 2016
Online Access:http://ndltd.ncl.edu.tw/handle/2dgu6t
id ndltd-TW-104NCKU5428027
record_format oai_dc
spelling ndltd-TW-104NCKU54280272019-05-15T22:54:09Z http://ndltd.ncl.edu.tw/handle/2dgu6t Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire 以CuInSe2奈米柱製備核殼結構二極體特性之研究 Chia-ChunLin 林嘉峻 碩士 國立成功大學 微電子工程研究所 104 CuInSe2 nanowire photovoltaic has been the subject of research with a view to enhancing the photo absorption efficiency and reducing the material consumption compared with bulk and thin-film PV. However, its surface recombination is a problem. Therefore, we use the core-shell structure to solve the problem. In this study, we employ the annealing process and tune the temperature to improve the crystallization of CIS nanowire. In I-V measurement, we obtained leakage current Io near 49.1nA. Then, we fabricated core-shell structure with PEDOT/CIS material to reduce the defects near the surface of nanowire. In I-V measurement, we obtained leakage current Io near 36.9nA. Mau-Phon Houng 洪茂峰 2016 學位論文 ; thesis 91 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立成功大學 === 微電子工程研究所 === 104 === CuInSe2 nanowire photovoltaic has been the subject of research with a view to enhancing the photo absorption efficiency and reducing the material consumption compared with bulk and thin-film PV. However, its surface recombination is a problem. Therefore, we use the core-shell structure to solve the problem. In this study, we employ the annealing process and tune the temperature to improve the crystallization of CIS nanowire. In I-V measurement, we obtained leakage current Io near 49.1nA. Then, we fabricated core-shell structure with PEDOT/CIS material to reduce the defects near the surface of nanowire. In I-V measurement, we obtained leakage current Io near 36.9nA.
author2 Mau-Phon Houng
author_facet Mau-Phon Houng
Chia-ChunLin
林嘉峻
author Chia-ChunLin
林嘉峻
spellingShingle Chia-ChunLin
林嘉峻
Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
author_sort Chia-ChunLin
title Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
title_short Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
title_full Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
title_fullStr Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
title_full_unstemmed Study of Core-Shell Diode Characteristic with CuInSe2 Nanowire
title_sort study of core-shell diode characteristic with cuinse2 nanowire
publishDate 2016
url http://ndltd.ncl.edu.tw/handle/2dgu6t
work_keys_str_mv AT chiachunlin studyofcoreshelldiodecharacteristicwithcuinse2nanowire
AT línjiājùn studyofcoreshelldiodecharacteristicwithcuinse2nanowire
AT chiachunlin yǐcuinse2nàimǐzhùzhìbèihékéjiégòuèrjítǐtèxìngzhīyánjiū
AT línjiājùn yǐcuinse2nàimǐzhùzhìbèihékéjiégòuèrjítǐtèxìngzhīyánjiū
_version_ 1719136871574929408