Energy Recovery for Dynamic Testing of Electronic Load

• Main Authors: HSIANG-SHENG LO, 羅翔生
• Other Authors: CHAO-HUA YANG
• Format: Others
• Language: zh-TW
• Published: 2016
• Online Access: http://ndltd.ncl.edu.tw/handle/75501802879268452714

碩士 === 明新科技大學 === 電機工程系碩士班 === 104 === The purpose of this thesis is to design and implement an energy recovery system to retrieve the energy unnecessary to be consumed on the electronic load during the dynamic test of DC power output devices. Generally, a DC power output device must be passed through a burn-in test in the dynamic mode before it leaves the factory. Traditionally, during the burn-in test, a DC power output device and its electronic load are connected in a circuitry loop. With the electronic load, different characteristics of a DC power output device can be verified with the burn-in test so as to ensure its stability and effectiveness in later use. Nevertheless, during the burn-in test, the energy transferred to the electronic load will become heat and hence lost. To retrieve such energy, in this thesis, a dynamic burn-in test is carried out with the electronic load so that the energy to be consumed unnecessarily by the electronic load can be retrieved back by an energy recovery system and at the same time a DC converter is used to adjust the voltage to a value suitable for other devices, thereby achieving the purpose of energy recovery.