Apply Big Data Analysis Technique with the Semiconductor Device Plating Machine Maintenance and Repair Data for Yield Improvement
碩士 === 國立高雄應用科技大學 === 電機工程系博碩士班 === 104 === In the history of the semiconductor industry in recent years, in 2008 IBM announced the copper process developed, IC process technology from aluminum process technology to copper process technology, announcing the coming copper Cheng era, so equipment man...
Main Authors: | YEH,PEI-CHIANG, 葉沛強 |
---|---|
Other Authors: | Chung-Hong Lee |
Format: | Others |
Language: | zh-TW |
Published: |
2016
|
Online Access: | http://ndltd.ncl.edu.tw/handle/88591648159975625762 |
Similar Items
-
Applying Data Mining Techniques for Device Repair and Maintenance in a Hospital
by: Ping-tsung Yeh, et al.
Published: (2012) -
Improvement of Semiconductor Process Yield Using Machine Learning and Big Data Analysis Techniques
by: YEN-HUNG Li, et al.
Published: (2017) -
Improvement For Semiconductor Porcess Yield By Big Data Analysis Technology With A Machine Learning And Statistical Method.
by: Shou-Cheng Cheng, et al.
Published: (2015) -
The Study of Applying Data Mining Techniques to the Yield Improvement of Semiconductor Manufacturing Process
by: Pin-Chieh Chen, et al.
Published: (2004) -
Information Security Maintenance Issues for Big Data
by: Sergey Vladimirovich Zapechnikov, et al.
Published: (2014-09-01)