Vertical Analysis Frequency-directed Run-length Coding for Test Data Compression

碩士 === 元智大學 === 資訊工程學系 === 103 === In this thesis, we propose a FDR based approach to improve test data compression rate. The main idea of the proposed approach is to analyze the original test data by partition them into blocks. We will fill the don't care bits in each block and see if the bloc...

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Bibliographic Details
Main Authors: Cheng-Ju Sung, 宋承儒
Other Authors: Wang-Dauh Tseng
Format: Others
Language:zh-TW
Online Access:http://ndltd.ncl.edu.tw/handle/10691577841673070553
Description
Summary:碩士 === 元智大學 === 資訊工程學系 === 103 === In this thesis, we propose a FDR based approach to improve test data compression rate. The main idea of the proposed approach is to analyze the original test data by partition them into blocks. We will fill the don't care bits in each block and see if the block is filled by 1 is better than by 0, the block will be encoded by FDR. If the block is encoded by FDR, the input of the corresponding sub-scan chain will be negate by a not gate. The experimental result shows the proposed approach can outperform than FDR coding.