Deterministic BIST Using Dual LFSR for Low-power Scan Testing
碩士 === 元智大學 === 資訊工程學系 === 103 === Power consumption and the volume of test data are popular topics in VLSI Testing field. These are the key factors that will determine the quality of the final data testing results in VLSI testing. Built-in self-test (BIST) architecture is a technique which can self...
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| Format: | Others |
| Language: | zh-TW |
| Online Access: | http://ndltd.ncl.edu.tw/handle/41443642798832395256 |