| Summary: | 碩士 === 國立臺北科技大學 === 自動化科技研究所 === 103 === The main diameter and length of integrated-circuit (IC) test probe barrel varies from 0.2 millimeter to 0.6 millimeter and from 1 millimeter to 7 millimeters, respectively. Also a probe has diverse heads of crown, piercing, and cone. However, probe implanting by human checking becomes tougher caused of the smaller probe. The paper aims to develop measurement system via machine vision that can inspect probe dimensions of segmented lengths, widths, and heads. The captured image was firstly detected the probe position. Projection method and one order differential method in the image are applied to get the paired coordinates of the segmented position. The flexible paired-point generation method searches measured points and the segmented length, width, or head can be calculated based on the measured point. Finally, the experimental results demonstrate that the proposed system can, respectively, achieve 92%, 100%, and 83% successful inspection rate of the segmented length, width, and head. In addition, the inspection of per probe is less than one second that can effectively measure the different probes.
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