Characterization of FinFET and UTBB SOI FETs with External Stresses and Back Bias Modulation
碩士 === 國立高雄大學 === 電機工程學系碩士班 === 103 === This thesis studies the effects of external stresses and back bias modulation for FinFETs and ultra-thin-body and box silicon-on-insulator (UTBB SOI) FEFs. The results show that UTBB SOI has larger threshold voltage and transconductance modulation compared to...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/32296263580650765305 |