Multiple Defect Physical-aware Diagnosis using Novel Dictionary

碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === This thesis presents a physical-aware diagnosis technique for failing dies with multiple defects using novel dictionary. Our diagnosis technique considers fault masking/reinforcement and Byzantine effects simultaneously. We identify sections that involved in...

Full description

Bibliographic Details
Main Authors:	Po-Hao Chen, 陳柏豪
Other Authors:	Chien-Mo Li
Format:	Others
Language:	en_US
Published:	2015
Online Access:	http://ndltd.ncl.edu.tw/handle/30984727084789246693

id	ndltd-TW-103NTU05428083
record_format	oai_dc
spelling	ndltd-TW-103NTU054280832016-11-19T04:09:47Z http://ndltd.ncl.edu.tw/handle/30984727084789246693 Multiple Defect Physical-aware Diagnosis using Novel Dictionary 使用新穎辭典並考慮實體資訊之多重缺陷診斷 Po-Hao Chen 陳柏豪碩士國立臺灣大學電子工程學研究所 103 This thesis presents a physical-aware diagnosis technique for failing dies with multiple defects using novel dictionary. Our diagnosis technique considers fault masking/reinforcement and Byzantine effects simultaneously. We identify sections that involved in a defect as the smallest diagnosis unit. Then, we propose section to physical site mapping technique to find culprit defects. Simulations on ISCAS’89 and ITC’99 benchmark circuits with multiple open-via defects demonstrate the effectiveness of our diagnosis technique. The accuracy is higher than commercial tool when more defects are injected. The accuracy of MD-PhD with 10 open-via defects injected (0.67) is much higher than commercial tool (0.31). Chien-Mo Li 李建模 2015 學位論文 ; thesis 50 en_US
collection	NDLTD
language	en_US
format	Others
sources	NDLTD
description	碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === This thesis presents a physical-aware diagnosis technique for failing dies with multiple defects using novel dictionary. Our diagnosis technique considers fault masking/reinforcement and Byzantine effects simultaneously. We identify sections that involved in a defect as the smallest diagnosis unit. Then, we propose section to physical site mapping technique to find culprit defects. Simulations on ISCAS’89 and ITC’99 benchmark circuits with multiple open-via defects demonstrate the effectiveness of our diagnosis technique. The accuracy is higher than commercial tool when more defects are injected. The accuracy of MD-PhD with 10 open-via defects injected (0.67) is much higher than commercial tool (0.31).
author2	Chien-Mo Li
author_facet	Chien-Mo Li Po-Hao Chen 陳柏豪
author	Po-Hao Chen 陳柏豪
spellingShingle	Po-Hao Chen 陳柏豪 Multiple Defect Physical-aware Diagnosis using Novel Dictionary
author_sort	Po-Hao Chen
title	Multiple Defect Physical-aware Diagnosis using Novel Dictionary
title_short	Multiple Defect Physical-aware Diagnosis using Novel Dictionary
title_full	Multiple Defect Physical-aware Diagnosis using Novel Dictionary
title_fullStr	Multiple Defect Physical-aware Diagnosis using Novel Dictionary
title_full_unstemmed	Multiple Defect Physical-aware Diagnosis using Novel Dictionary
title_sort	multiple defect physical-aware diagnosis using novel dictionary
publishDate	2015
url	http://ndltd.ncl.edu.tw/handle/30984727084789246693
work_keys_str_mv	AT pohaochen multipledefectphysicalawarediagnosisusingnoveldictionary AT chénbǎiháo multipledefectphysicalawarediagnosisusingnoveldictionary AT pohaochen shǐyòngxīnyǐngcídiǎnbìngkǎolǜshítǐzīxùnzhīduōzhòngquēxiànzhěnduàn AT chénbǎiháo shǐyòngxīnyǐngcídiǎnbìngkǎolǜshítǐzīxùnzhīduōzhòngquēxiànzhěnduàn
_version_	1718395059713343488

Multiple Defect Physical-aware Diagnosis using Novel Dictionary

Similar Items