Multiple Defect Physical-aware Diagnosis using Novel Dictionary
碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === This thesis presents a physical-aware diagnosis technique for failing dies with multiple defects using novel dictionary. Our diagnosis technique considers fault masking/reinforcement and Byzantine effects simultaneously. We identify sections that involved in...
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| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/30984727084789246693 |
| Summary: | 碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === This thesis presents a physical-aware diagnosis technique for failing dies with multiple defects using novel dictionary. Our diagnosis technique considers fault masking/reinforcement and Byzantine effects simultaneously. We identify sections that involved in a defect as the smallest diagnosis unit. Then, we propose section to physical site mapping technique to find culprit defects. Simulations on ISCAS’89 and ITC’99 benchmark circuits with multiple open-via defects demonstrate the effectiveness of our diagnosis technique. The accuracy is higher than commercial tool when more defects are injected. The accuracy of MD-PhD with 10 open-via defects injected (0.67) is much higher than commercial tool (0.31).
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