Android Bug Pattern Extraction Library

• Main Authors: Ming-En Hsu, 許明恩
• Other Authors: 王凡
• Format: Others
• Language: en_US
• Published: 2015
• Online Access: http://ndltd.ncl.edu.tw/handle/07882212486999014361

碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === Android dominated the mobile operating system market with a 80% share. However, most of Android apps are not adequately tested [23] before they are released for public use. There are two paradigm shifts making present testing works are more complicated than before. First, test engineer have to deal with system under test (SUT) without source code. Second, test engineer have to test SUT without up-to-date documentation. Therefore, there is a growing need for automated testing techniques aimed at Android apps. In this thesis, we introduce an Android Bug Pattern Extraction Library. This library can cluster fail traces by different types of crash, mine association temporal rules that is the most likely one lead to crash and generating test cases by the rules. We provide a service, which make developer find existing bugs in the Apps. By this analysis library, developers can automate their testing process to reduce costs of money and time.