DR-scan: A Test Methodology for Dual-rail Asynchronous Circuits
碩士 === 國立臺灣大學 === 電子工程學研究所 === 103 === This thesis presents a test methodology, Dual-rail scan (DR-scan), for dual-rail asynchronous circuits. We propose a full-scan design for testability (DfT) technique, which uses all four codewords in dual-rail logic so that scan chains can be shifted without c...
| Main Authors: | , |
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| Format: | Others |
| Language: | en_US |
| Published: |
2014
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| Online Access: | http://ndltd.ncl.edu.tw/handle/r5v75f |