The Study and Development of a Novel High-Density Embedded AND-type Spilt Gate Flash Memory
碩士 === 國立清華大學 === 電子工程研究所 === 103 === Nowadays, due to the benefits of its high program efficiency, low power consumption, and over-erase immunity, split gate flash cells are widely used in both stand-alone products and embedded applications. However, the asymmetric structure of spilt gate device li...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/16949214677687487305 |