The Time-Resolved X-Ray Diffraction:The Study of Laser Induced Strain Propagating in Layered System

• Main Authors: Liu, Hsing Yu, 劉星佑
• Other Authors: Chang, Shih Lin
• Format: Others
• Language: zh-TW
• Published: 2015
• Online Access: http://ndltd.ncl.edu.tw/handle/et5neg

碩士 === 國立清華大學 === 物理系 === 103 === This thesis aims to propose theoretical calculations and experimental simulation for the time-resolved X-ray diffraction which is using the pump & probe experimental method in the system of epitaxial thin film of two different materials. The system is an InN epitaxial single-crystal thin film grown on sapphire substrate. We use the theory which is proposed by C. Thomsen[5], and then put forward the theoretical calculations of the laser induced strain propagating in a layered system. We also use the system of X-ray diffraction in multi-layer thin films to simulate the X-ray reflectance in the time-resolved X-ray diffraction experiment. Under different times and X-ray incidence angle, we successfully simulate the measurement results of the time-resolved X-ray diffraction experiment.