Projected Fringe Profilometry Techniques Using for Specular Surfacess
碩士 === 國立中山大學 === 材料與光電科學學系研究所 === 103 === A fringe projection method for specular is presented. For specular objects, only part of the refracted light can be detected by a CCD camera. Thus, the typical projected fringe profilometry cannot be used for specular surfaces. In the proposed method, a fri...
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| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/ftzh38 |
| Summary: | 碩士 === 國立中山大學 === 材料與光電科學學系研究所 === 103 === A fringe projection method for specular is presented. For specular objects, only part of the refracted light can be detected by a CCD camera. Thus, the typical projected fringe profilometry cannot be used for specular surfaces. In the proposed method, a fringe pattern is posited in front of the specular surface. A virtual image therefore is produced behind the specular surface. Fringes on the virtual image are deformed by topography of the specular place the object. Thus, phase of the deformed fringes is desirable to retrieve the profile of the specular surface. The measurement setup is simple and robotic, and the computation cost is low. Its one-shot measurement property also makes it possible to inspect dynamic objects.
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