| Summary: | 碩士 === 國立嘉義大學 === 電子物理學系光電暨固態電子研究所 === 103 === In this experienment, we used Magnetic-Optical disc to be a standard sample, with its hard magnetic recording area to correct probe of Magnatic Force Microscopy for measuring and analysis.
There are two parts of probe correction, first is change the measure distance between probe and sample. The research result shown that the probe and sample surface keep the distance with 80nm, record area will get detailed outline of the magnetic domain. We can see the significant light, dark and intermediate color magnetic zone distribution, and the van der Waals' force between probe and sample is decreasing. The image we got called magnetic imaging. Second, change the size and direction of magnetization of probe. When an external magnetic field in a vertical manner to 2720 Oe magnetic probes were measured through a magnetic image maps we found that the magnetic domain distribution and magnetic signals are at their best status. From this, when the vertical mode 2720 Oe magnetic field probes, probe of saturation magnetization state, the case will be the best resolution of the MFM image. When the applied magnetic field parallel manner to 680 Oe field strength, the same resolve to produce the best effect MFM, the results thus characteristic that the probe has reached the saturation magnetization state at this time.
In the soft sample analysis, previously measured by the standard sample findings that, vertically applied magnetic field 2720 Oe magnetic probe on the probe to reach the saturation magnetization parallel manner after the probe magnetization 680 Oe applied magnetic field on the probe after it reaches saturation magnetization. These ways are the most conducive to the probe measurement, that is to produce the best effect of the magnetic image parsing, so we chose the two magnetization measurement parameters, and apply Co (150 nm) / Si thin film magnetic MFM measurement, through analysis results can be confirmed using a parallel way of measuring saturation magnetization amount of probe Co (150nm) / Si sample, the process will synchronize magnetization level surface magnetic moment, magnetic force microscopy instrument by viewing an image of the saturation magnetization after this the results can also be compared and validated with the L-MOKE data to each other.
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