Hardware in the loop testing of the Impact Enlarged Microgravity Meter.

碩士 === 國立中央大學 === 光機電工程研究所 === 103 === Micro gravity environment is difficult to obtain, if is desirable to verify the functionality of a microgravity meter during its development before its real tests in the micro gravity environment. A computerized mems accelerator emulator is developed to generat...

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Main Authors: WUN-YUAN JIAN, 簡文淵
Other Authors: 葉則亮
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/44by94
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spelling ndltd-TW-103NCU056510112019-05-15T22:08:46Z http://ndltd.ncl.edu.tw/handle/44by94 Hardware in the loop testing of the Impact Enlarged Microgravity Meter. 衝擊放大式微重力計硬體在迴路測試 WUN-YUAN JIAN 簡文淵 碩士 國立中央大學 光機電工程研究所 103 Micro gravity environment is difficult to obtain, if is desirable to verify the functionality of a microgravity meter during its development before its real tests in the micro gravity environment. A computerized mems accelerator emulator is developed to generate its electric signals lased on the simulation results of the sensing function of the Impact Enlarged Micro gravity Meter in a real test. The emulated signals until stimulate the control system of the micro gravity meter to confirm its correct response to the real impact data of would be real micro gravity test. 葉則亮 2015 學位論文 ; thesis 48 zh-TW
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language zh-TW
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description 碩士 === 國立中央大學 === 光機電工程研究所 === 103 === Micro gravity environment is difficult to obtain, if is desirable to verify the functionality of a microgravity meter during its development before its real tests in the micro gravity environment. A computerized mems accelerator emulator is developed to generate its electric signals lased on the simulation results of the sensing function of the Impact Enlarged Micro gravity Meter in a real test. The emulated signals until stimulate the control system of the micro gravity meter to confirm its correct response to the real impact data of would be real micro gravity test.
author2 葉則亮
author_facet 葉則亮
WUN-YUAN JIAN
簡文淵
author WUN-YUAN JIAN
簡文淵
spellingShingle WUN-YUAN JIAN
簡文淵
Hardware in the loop testing of the Impact Enlarged Microgravity Meter.
author_sort WUN-YUAN JIAN
title Hardware in the loop testing of the Impact Enlarged Microgravity Meter.
title_short Hardware in the loop testing of the Impact Enlarged Microgravity Meter.
title_full Hardware in the loop testing of the Impact Enlarged Microgravity Meter.
title_fullStr Hardware in the loop testing of the Impact Enlarged Microgravity Meter.
title_full_unstemmed Hardware in the loop testing of the Impact Enlarged Microgravity Meter.
title_sort hardware in the loop testing of the impact enlarged microgravity meter.
publishDate 2015
url http://ndltd.ncl.edu.tw/handle/44by94
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