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碩士 === 國立中央大學 === 機械工程學系 === 103 === In this study, OES (Optical emission spectrometer), and QMS (Quadrupole mass spectrometry) were utilized as plasma diagnostics tools and a-Si:H (Hydrogenated amorphous silicon ) thin film was deposited by electron cyclotron resonance chemical vapor deposition (EC...

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Bibliographic Details
Main Authors: Yu-wei Lin, 林育緯
Other Authors: 利定東
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/18595524124748266715
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by Yu-Wei Lin, 林育蔚
Published 2006
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