Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment

碩士 === 國立暨南國際大學 === 電機工程學系 === 103 === In order to quickly manufacture samples of recession to near ultraviolet light-emitting diode, we use three different methods for experiment. First, put LED in steam environment and execute reverse bias’s operation continually. We found that the result of the g...

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Main Authors: Huan-Yu Shen, 沈奐宇
Other Authors: Meng-Lieh Sheu
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/04307173876990927078
id ndltd-TW-103NCNU0442057
record_format oai_dc
spelling ndltd-TW-103NCNU04420572016-08-28T04:12:10Z http://ndltd.ncl.edu.tw/handle/04307173876990927078 Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment 觀察氮化鎵鋁/氮化鎵發光二極體在鹽水操作環境下的可靠性研究 Huan-Yu Shen 沈奐宇 碩士 國立暨南國際大學 電機工程學系 103 In order to quickly manufacture samples of recession to near ultraviolet light-emitting diode, we use three different methods for experiment. First, put LED in steam environment and execute reverse bias’s operation continually. We found that the result of the gold particles’ diffusion is similar to the former experiment of the red light-emitting diode’s diffusion, but the situation of gold particles’ diffusion is far more serious. Second, put LED in salt spray environment and execute forward bias’s operation continually. In this way, we use two different intensity of current to observe the recession. The result shows that chloride ion in salt spray environment has the phenomenon of diffusion. After that we executed a comparison of continually forward bias’s and reverse bias’s operation in steam environment and in salt spray environment, we found that the surface of the sample by forward bias’s operation has the phenomenon of heat accumulation, and the electrode pad of the sample by reverse bias’s operation has the phenomenon of heat accumulation. These phenomena could be called ‘’current crowding’’. The third method, which is based on the second experiment, subdivided forward bias’s current into three different groups by intensity to do electrical reliability tests and compare the differences.By various reliability analyses, such as Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), Electron Spectroscopy of Chemical Analysis (ESCA), Energy dispersive X-ray spectroscopy (EDX), these electric and optical measurements and Thermal Image Process can observe the surface’s lighting and structural deterioration of aluminum gallium nitride (GaAlN) ultraviolet light-emitting diode in damp environment. Meng-Lieh Sheu Hsiang Chen 許孟烈 陳 祥 2015 學位論文 ; thesis 72 zh-TW
collection NDLTD
language zh-TW
format Others
sources NDLTD
description 碩士 === 國立暨南國際大學 === 電機工程學系 === 103 === In order to quickly manufacture samples of recession to near ultraviolet light-emitting diode, we use three different methods for experiment. First, put LED in steam environment and execute reverse bias’s operation continually. We found that the result of the gold particles’ diffusion is similar to the former experiment of the red light-emitting diode’s diffusion, but the situation of gold particles’ diffusion is far more serious. Second, put LED in salt spray environment and execute forward bias’s operation continually. In this way, we use two different intensity of current to observe the recession. The result shows that chloride ion in salt spray environment has the phenomenon of diffusion. After that we executed a comparison of continually forward bias’s and reverse bias’s operation in steam environment and in salt spray environment, we found that the surface of the sample by forward bias’s operation has the phenomenon of heat accumulation, and the electrode pad of the sample by reverse bias’s operation has the phenomenon of heat accumulation. These phenomena could be called ‘’current crowding’’. The third method, which is based on the second experiment, subdivided forward bias’s current into three different groups by intensity to do electrical reliability tests and compare the differences.By various reliability analyses, such as Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), Electron Spectroscopy of Chemical Analysis (ESCA), Energy dispersive X-ray spectroscopy (EDX), these electric and optical measurements and Thermal Image Process can observe the surface’s lighting and structural deterioration of aluminum gallium nitride (GaAlN) ultraviolet light-emitting diode in damp environment.
author2 Meng-Lieh Sheu
author_facet Meng-Lieh Sheu
Huan-Yu Shen
沈奐宇
author Huan-Yu Shen
沈奐宇
spellingShingle Huan-Yu Shen
沈奐宇
Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
author_sort Huan-Yu Shen
title Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
title_short Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
title_full Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
title_fullStr Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
title_full_unstemmed Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
title_sort observing the reliability of algan/gan light-emitting diode in the operation of salted environment
publishDate 2015
url http://ndltd.ncl.edu.tw/handle/04307173876990927078
work_keys_str_mv AT huanyushen observingthereliabilityofalganganlightemittingdiodeintheoperationofsaltedenvironment
AT chénhuànyǔ observingthereliabilityofalganganlightemittingdiodeintheoperationofsaltedenvironment
AT huanyushen guānchádànhuàjiālǚdànhuàjiāfāguāngèrjítǐzàiyánshuǐcāozuòhuánjìngxiàdekěkàoxìngyánjiū
AT chénhuànyǔ guānchádànhuàjiālǚdànhuàjiāfāguāngèrjítǐzàiyánshuǐcāozuòhuánjìngxiàdekěkàoxìngyánjiū
_version_ 1718380646711164928