Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment
碩士 === 國立暨南國際大學 === 電機工程學系 === 103 === In order to quickly manufacture samples of recession to near ultraviolet light-emitting diode, we use three different methods for experiment. First, put LED in steam environment and execute reverse bias’s operation continually. We found that the result of the g...
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ndltd-TW-103NCNU04420572016-08-28T04:12:10Z http://ndltd.ncl.edu.tw/handle/04307173876990927078 Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment 觀察氮化鎵鋁/氮化鎵發光二極體在鹽水操作環境下的可靠性研究 Huan-Yu Shen 沈奐宇 碩士 國立暨南國際大學 電機工程學系 103 In order to quickly manufacture samples of recession to near ultraviolet light-emitting diode, we use three different methods for experiment. First, put LED in steam environment and execute reverse bias’s operation continually. We found that the result of the gold particles’ diffusion is similar to the former experiment of the red light-emitting diode’s diffusion, but the situation of gold particles’ diffusion is far more serious. Second, put LED in salt spray environment and execute forward bias’s operation continually. In this way, we use two different intensity of current to observe the recession. The result shows that chloride ion in salt spray environment has the phenomenon of diffusion. After that we executed a comparison of continually forward bias’s and reverse bias’s operation in steam environment and in salt spray environment, we found that the surface of the sample by forward bias’s operation has the phenomenon of heat accumulation, and the electrode pad of the sample by reverse bias’s operation has the phenomenon of heat accumulation. These phenomena could be called ‘’current crowding’’. The third method, which is based on the second experiment, subdivided forward bias’s current into three different groups by intensity to do electrical reliability tests and compare the differences.By various reliability analyses, such as Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), Electron Spectroscopy of Chemical Analysis (ESCA), Energy dispersive X-ray spectroscopy (EDX), these electric and optical measurements and Thermal Image Process can observe the surface’s lighting and structural deterioration of aluminum gallium nitride (GaAlN) ultraviolet light-emitting diode in damp environment. Meng-Lieh Sheu Hsiang Chen 許孟烈 陳 祥 2015 學位論文 ; thesis 72 zh-TW |
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碩士 === 國立暨南國際大學 === 電機工程學系 === 103 === In order to quickly manufacture samples of recession to near ultraviolet light-emitting diode, we use three different methods for experiment. First, put LED in steam environment and execute reverse bias’s operation continually. We found that the result of the gold particles’ diffusion is similar to the former experiment of the red light-emitting diode’s diffusion, but the situation of gold particles’ diffusion is far more serious. Second, put LED in salt spray environment and execute forward bias’s operation continually. In this way, we use two different intensity of current to observe the recession. The result shows that chloride ion in salt spray environment has the phenomenon of diffusion. After that we executed a comparison of continually forward bias’s and reverse bias’s operation in steam environment and in salt spray environment, we found that the surface of the sample by forward bias’s operation has the phenomenon of heat accumulation, and the electrode pad of the sample by reverse bias’s operation has the phenomenon of heat accumulation. These phenomena could be called ‘’current crowding’’. The third method, which is based on the second experiment, subdivided forward bias’s current into three different groups by intensity to do electrical reliability tests and compare the differences.By various reliability analyses, such as Focused Ion Beam (FIB), Scanning Electron Microscope (SEM), Electron Spectroscopy of Chemical Analysis (ESCA), Energy dispersive X-ray spectroscopy (EDX), these electric and optical measurements and Thermal Image Process can observe the surface’s lighting and structural deterioration of aluminum gallium nitride (GaAlN) ultraviolet light-emitting diode in damp environment.
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author2 |
Meng-Lieh Sheu |
author_facet |
Meng-Lieh Sheu Huan-Yu Shen 沈奐宇 |
author |
Huan-Yu Shen 沈奐宇 |
spellingShingle |
Huan-Yu Shen 沈奐宇 Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment |
author_sort |
Huan-Yu Shen |
title |
Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment |
title_short |
Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment |
title_full |
Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment |
title_fullStr |
Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment |
title_full_unstemmed |
Observing the Reliability of AlGaN/GaN Light-Emitting Diode in the Operation of Salted Environment |
title_sort |
observing the reliability of algan/gan light-emitting diode in the operation of salted environment |
publishDate |
2015 |
url |
http://ndltd.ncl.edu.tw/handle/04307173876990927078 |
work_keys_str_mv |
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