Study of Silicon Stress-Memorization-Techniques induced- Edge Dislocation Formation Mechanism and Its Effects on Device Performance
博士 === 國立成功大學 === 微電子工程研究所 === 103
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | en_US |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/b7246j |
| Summary: | 博士 === 國立成功大學 === 微電子工程研究所 === 103 |
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