To Investigate the Effects of Different Passivation on the IGZO TFTs under the Thermal Anneal and Reliability Test
碩士 === 國立中興大學 === 光電工程研究所 === 103 === Recently, the consumer electronics have brought the research and development of the display technology. Therefore, the characteristics of the TFTs must be enhanced to meet the requirements of the large size, high resolution and the wearable products. In addition...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/15002867562942601197 |