Surface defect detection system applied in enameled process -- taking plant A as an example

• Main Authors: Yu-Kai Wang, 王昱凱
• Other Authors: Shang-Chou Chang
• Format: Others
• Language: zh-TW
• Published: 2015
• Online Access: http://ndltd.ncl.edu.tw/handle/znth54

碩士 === 崑山科技大學 === 電機工程研究所 === 103 === “Blister”, the defect on the surface of enameled wire, is the bulge on the enamel film after baking, which may be caused by the coating condition or other causes. The elasticity, mechanical strength and electrical insulation of enameled wire may weaken due to the existence of blisters. Furthermore, the life of enamel wire and the operation of final product will shorten as well. Both the Chinese National Standards (CNS 8938) and most enameled wire producers apply the off-line examination. (Which means the wire will be examined after produced.) However, the appearance of the whole spool is not guaranteed due to the limited inspection. The surface defect detecting system mentioned in this study operates online, so it is able to accomplish the examination and detection throughout the process, which improves the quality of enameled wire. Therefore, Plant A is introduced in this study. The experience of applying online detecting system in Plant A proved that this system is not only able to detect the actual location of blister and its occurrence time, but meanwhile, lowered the production defect rate of Plant A to 15% in 2014. Moreover, the complaint received from customers has reduced to 4%. With this example, the effectiveness of the defect detecting system is sufficiently approved.