| Summary: | 碩士 === 逢甲大學 === 資訊工程學系 === 103 === Recently, the concern with performance of the enterprise applications has been growing. For an enterprise, the performance of its application has great impact on the cost of operations. Moreover, application performance also dominates degree of customers’ satisfaction as well as the reputation of a business. In early days, it is common in the semiconductor examination industry to design their enterprise applications based on traditional e-commerce’s three-layer system architecture. However, with the advances of wafer fabrication technologies, the volume of data to be processed by the application is becoming too large to be handled by the traditional e-commerce architecture within a reasonable time. In this thesis, the author attempts to use a variety of strategies to analyze and to improve performance of an enterprise application in a real wafer examination factory. Three different approaches are designed to improve performance, including multi-thread, distributed processing, and functional programming. To verify the effects of the proposed approaches, the author also conducts a series of experiments for performance tests.
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