Applying of PAT test method in the Diode of semiconductor to screen out the potential failure
碩士 === 中華科技大學 === 經營管理研究所 === 103 === The manufacturers of semiconductor devices are often troubled by a problem, that is, although the devices are fabricated strictly in accordance with a standardized operating procedure, which are then followed by various quality monitoring steps, even a 100% chec...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Others |
| Language: | zh-TW |
| Published: |
2015
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| Online Access: | http://ndltd.ncl.edu.tw/handle/t6rc88 |