Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells

碩士 === 國立中正大學 === 電機工程研究所 === 103

Bibliographic Details
Main Authors: Xuan-Yu Lin, 林軒宇
Other Authors: Jinn-Shyan Wang
Format: Others
Language:zh-TW
Published: 2015
Online Access:http://ndltd.ncl.edu.tw/handle/dx7498
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spelling ndltd-TW-103CCU004421032019-05-15T22:08:03Z http://ndltd.ncl.edu.tw/handle/dx7498 Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells 可以位元交錯擺放之二八奈米超低電壓靜態隨機存取記憶體之設計與比較研究 Xuan-Yu Lin 林軒宇 碩士 國立中正大學 電機工程研究所 103 Jinn-Shyan Wang 王進賢 2015 學位論文 ; thesis 55 zh-TW
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language zh-TW
format Others
sources NDLTD
description 碩士 === 國立中正大學 === 電機工程研究所 === 103
author2 Jinn-Shyan Wang
author_facet Jinn-Shyan Wang
Xuan-Yu Lin
林軒宇
author Xuan-Yu Lin
林軒宇
spellingShingle Xuan-Yu Lin
林軒宇
Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells
author_sort Xuan-Yu Lin
title Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells
title_short Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells
title_full Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells
title_fullStr Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells
title_full_unstemmed Design and Comparative Study of 28nm ULV Bit-Interleaved SRAM Cells
title_sort design and comparative study of 28nm ulv bit-interleaved sram cells
publishDate 2015
url http://ndltd.ncl.edu.tw/handle/dx7498
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