Effects of Drift-Region design on the Reliability of 800V LDMOS

碩士 === 亞洲大學 === 資訊工程學系 === 102

Bibliographic Details
Main Author: Vivek Ningaraju
Other Authors: Gene sheu
Format: Others
Language:en_US
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/21349149177477554583
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spelling ndltd-TW-102THMU03960072017-11-10T04:25:30Z http://ndltd.ncl.edu.tw/handle/21349149177477554583 Effects of Drift-Region design on the Reliability of 800V LDMOS Effects of Drift-Region design on the Reliability of 800V LDMOS Vivek Ningaraju Vivek Ningaraju 碩士 亞洲大學 資訊工程學系 102 Gene sheu 許健 2014 學位論文 ; thesis 76 en_US
collection NDLTD
language en_US
format Others
sources NDLTD
description 碩士 === 亞洲大學 === 資訊工程學系 === 102
author2 Gene sheu
author_facet Gene sheu
Vivek Ningaraju
Vivek Ningaraju
author Vivek Ningaraju
Vivek Ningaraju
spellingShingle Vivek Ningaraju
Vivek Ningaraju
Effects of Drift-Region design on the Reliability of 800V LDMOS
author_sort Vivek Ningaraju
title Effects of Drift-Region design on the Reliability of 800V LDMOS
title_short Effects of Drift-Region design on the Reliability of 800V LDMOS
title_full Effects of Drift-Region design on the Reliability of 800V LDMOS
title_fullStr Effects of Drift-Region design on the Reliability of 800V LDMOS
title_full_unstemmed Effects of Drift-Region design on the Reliability of 800V LDMOS
title_sort effects of drift-region design on the reliability of 800v ldmos
publishDate 2014
url http://ndltd.ncl.edu.tw/handle/21349149177477554583
work_keys_str_mv AT vivekningaraju effectsofdriftregiondesignonthereliabilityof800vldmos
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