Effects of Drift-Region design on the Reliability of 800V LDMOS
碩士 === 亞洲大學 === 資訊工程學系 === 102
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ndltd-TW-102THMU03960072017-11-10T04:25:30Z http://ndltd.ncl.edu.tw/handle/21349149177477554583 Effects of Drift-Region design on the Reliability of 800V LDMOS Effects of Drift-Region design on the Reliability of 800V LDMOS Vivek Ningaraju Vivek Ningaraju 碩士 亞洲大學 資訊工程學系 102 Gene sheu 許健 2014 學位論文 ; thesis 76 en_US |
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en_US |
format |
Others
|
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description |
碩士 === 亞洲大學 === 資訊工程學系 === 102 |
author2 |
Gene sheu |
author_facet |
Gene sheu Vivek Ningaraju Vivek Ningaraju |
author |
Vivek Ningaraju Vivek Ningaraju |
spellingShingle |
Vivek Ningaraju Vivek Ningaraju Effects of Drift-Region design on the Reliability of 800V LDMOS |
author_sort |
Vivek Ningaraju |
title |
Effects of Drift-Region design on the Reliability of 800V LDMOS |
title_short |
Effects of Drift-Region design on the Reliability of 800V LDMOS |
title_full |
Effects of Drift-Region design on the Reliability of 800V LDMOS |
title_fullStr |
Effects of Drift-Region design on the Reliability of 800V LDMOS |
title_full_unstemmed |
Effects of Drift-Region design on the Reliability of 800V LDMOS |
title_sort |
effects of drift-region design on the reliability of 800v ldmos |
publishDate |
2014 |
url |
http://ndltd.ncl.edu.tw/handle/21349149177477554583 |
work_keys_str_mv |
AT vivekningaraju effectsofdriftregiondesignonthereliabilityof800vldmos AT vivekningaraju effectsofdriftregiondesignonthereliabilityof800vldmos |
_version_ |
1718560646564413440 |