The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material

碩士 === 南台科技大學 === 光電工程系 === 102 === High-efficiency light-emitting diode (LED) had became the main trends of the present study.In this thesis, We study how to increase light extraction efficiency of light-emitting diode increases.The theoretical basis of the research methods was the total internal r...

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Main Authors: Lai,Jyun-Wei, 賴鈞偉
Other Authors: Kuan Hung
Format: Others
Language:zh-TW
Published: 103
Online Access:http://ndltd.ncl.edu.tw/handle/a4bbs7
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spelling ndltd-TW-102STUT81240082019-08-01T03:45:41Z http://ndltd.ncl.edu.tw/handle/a4bbs7 The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material 矽基氮化鎵發光二極體材料之研究 Lai,Jyun-Wei 賴鈞偉 碩士 南台科技大學 光電工程系 102 High-efficiency light-emitting diode (LED) had became the main trends of the present study.In this thesis, We study how to increase light extraction efficiency of light-emitting diode increases.The theoretical basis of the research methods was the total internal reflection (Total Internal Reflection, TIR) of the grain size was reduced.In order to improve this factor, the research focused on improving its internal structure to increase the efficiency of light-emitting diodes. Explore the impact of differences in the two different heat treatment process, the electrical and optical properties. In the analysis of material properties,we use the transmission line model (TLM) measuring the electrical characteristics of the film and x-ray diffraction (XRD) analysis of the crystal film quality and with UV / Vis spectrophotometer (UV / VIS spectrometer) was measured optical transmission properties of the film, scanning electron microscopy (SEM) to observe the variations of the film surface.Using the above measurements to investigate the crystal structure to make quality and optical, electrical and surface properties of the films, and these result in component design. In this study,we used electron beam evaporation (E-beam) to deposited the transparent conductive film, a thin film of aluminum zinc oxide (AZO) film of silver (Ag) as an interleaved multi-layer transparent electrode deposition, and thus AZO / Ag / AZO multilayer structure as N-type electrode GaN (n-GaN) and the P-type GaN (p-GaN) transmission line elements, and to study the characteristics of the transparent conductive film and the contact between the semiconductor.First, the film thickness at the fixed temperature, by depositing a thin film grown in different environmental conditions, the heat treatment made sample by high temperature in the annealing furnace tube . By changing the heat treatment parameters and observe the changes of electrical resistance.The effects of these parameters on the optical properties of the film and find the best optical properties, this film finally grow on gallium nitride (GaN) light-emitting diodes.It’s observed that the resistivity of 5.14 ×10-3 Ω-cm, the contact resistance of 0.0883 Ω-cm2 and approximately 85.7% at 460nm film transmittance via annealing the Oxygen (O2). Kuan Hung 管鴻 103 學位論文 ; thesis 71 zh-TW
collection NDLTD
language zh-TW
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description 碩士 === 南台科技大學 === 光電工程系 === 102 === High-efficiency light-emitting diode (LED) had became the main trends of the present study.In this thesis, We study how to increase light extraction efficiency of light-emitting diode increases.The theoretical basis of the research methods was the total internal reflection (Total Internal Reflection, TIR) of the grain size was reduced.In order to improve this factor, the research focused on improving its internal structure to increase the efficiency of light-emitting diodes. Explore the impact of differences in the two different heat treatment process, the electrical and optical properties. In the analysis of material properties,we use the transmission line model (TLM) measuring the electrical characteristics of the film and x-ray diffraction (XRD) analysis of the crystal film quality and with UV / Vis spectrophotometer (UV / VIS spectrometer) was measured optical transmission properties of the film, scanning electron microscopy (SEM) to observe the variations of the film surface.Using the above measurements to investigate the crystal structure to make quality and optical, electrical and surface properties of the films, and these result in component design. In this study,we used electron beam evaporation (E-beam) to deposited the transparent conductive film, a thin film of aluminum zinc oxide (AZO) film of silver (Ag) as an interleaved multi-layer transparent electrode deposition, and thus AZO / Ag / AZO multilayer structure as N-type electrode GaN (n-GaN) and the P-type GaN (p-GaN) transmission line elements, and to study the characteristics of the transparent conductive film and the contact between the semiconductor.First, the film thickness at the fixed temperature, by depositing a thin film grown in different environmental conditions, the heat treatment made sample by high temperature in the annealing furnace tube . By changing the heat treatment parameters and observe the changes of electrical resistance.The effects of these parameters on the optical properties of the film and find the best optical properties, this film finally grow on gallium nitride (GaN) light-emitting diodes.It’s observed that the resistivity of 5.14 ×10-3 Ω-cm, the contact resistance of 0.0883 Ω-cm2 and approximately 85.7% at 460nm film transmittance via annealing the Oxygen (O2).
author2 Kuan Hung
author_facet Kuan Hung
Lai,Jyun-Wei
賴鈞偉
author Lai,Jyun-Wei
賴鈞偉
spellingShingle Lai,Jyun-Wei
賴鈞偉
The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material
author_sort Lai,Jyun-Wei
title The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material
title_short The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material
title_full The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material
title_fullStr The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material
title_full_unstemmed The Research of Silicon-based Gallium Nitride Light Emitting Diodes Material
title_sort research of silicon-based gallium nitride light emitting diodes material
publishDate 103
url http://ndltd.ncl.edu.tw/handle/a4bbs7
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