The Application of RFID Technology for IC Testing Flow Control

碩士 === 國立高雄大學 === 電機工程學系碩士班 === 102 === 紙本專利開放日104.07.30

Bibliographic Details
Main Authors: Yu-Jen Cheng, 鄭又仁
Other Authors: Ming-Chang Shih
Format: Others
Language:zh-TW
Published: 2014
Online Access:http://ndltd.ncl.edu.tw/handle/94277754377679304704
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spelling ndltd-TW-102NUK054420482016-05-22T04:40:27Z http://ndltd.ncl.edu.tw/handle/94277754377679304704 The Application of RFID Technology for IC Testing Flow Control 無線射頻(RFID)技術導入IC測試流程管理之研究 Yu-Jen Cheng 鄭又仁 碩士 國立高雄大學 電機工程學系碩士班 102 紙本專利開放日104.07.30 Ming-Chang Shih 施明昌 2014 學位論文 ; thesis 55 zh-TW
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description 碩士 === 國立高雄大學 === 電機工程學系碩士班 === 102 === 紙本專利開放日104.07.30
author2 Ming-Chang Shih
author_facet Ming-Chang Shih
Yu-Jen Cheng
鄭又仁
author Yu-Jen Cheng
鄭又仁
spellingShingle Yu-Jen Cheng
鄭又仁
The Application of RFID Technology for IC Testing Flow Control
author_sort Yu-Jen Cheng
title The Application of RFID Technology for IC Testing Flow Control
title_short The Application of RFID Technology for IC Testing Flow Control
title_full The Application of RFID Technology for IC Testing Flow Control
title_fullStr The Application of RFID Technology for IC Testing Flow Control
title_full_unstemmed The Application of RFID Technology for IC Testing Flow Control
title_sort application of rfid technology for ic testing flow control
publishDate 2014
url http://ndltd.ncl.edu.tw/handle/94277754377679304704
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